Design diffraction gratings and metasurfaces together with the thin-film stack they sit on. Every diffraction order by two independent methods, RCWA and FDTD; the pattern and the films optimized jointly; robustness checked against the errors of a real process — from any computer, for $100/month.
Efficiency of each propagating order in reflection and transmission, with total R and T, over the wavelength range and the angles of incidence — recomputed as you edit.
RCWA for speed, FDTD as an independent check — drawn on one chart with the largest difference of every curve. Where the two agree, the spectrum is right.
Film thicknesses, pattern height, shape sizes and rotations, and the period refined together against order-resolved targets — over fields of directions and both polarizations.
The group delay and its dispersion of every order from analytic wavelength derivatives — by RCWA and by FDTD — and GD/GDD targets for ultrafast optics.
Monte Carlo tests of the errors of the films, the pattern height, the shape sizes and the period: the yield, the verdict and which parameter the process must hold tightest.
No installation: FDTD runs on our servers, GPU included. One OptiLayer Online account and one card for MetaLayer Web and AstraLayer.
Rigorous coupled-wave analysis: the fields in Fourier orders, milliseconds per wavelength, its accuracy set by the orders kept. Rectangles, ellipses and circles on 1-D, rectangular and hexagonal lattices.
Finite differences in the time domain on a Yee grid, on the CPU or the GPU — an independent method whose errors share nothing with RCWA's, the cells per wavelength setting its accuracy.
Damped least squares over the free parameters of the pattern and the stack, against efficiency, GD and GDD targets — bounds, fields of directions and polarizations included.
A library of optical constants with their sources, tables of your own, and the substrate as an absorbing plate with its back face when it matters.
From a Littrow grating on a mirror to the in-coupler of an AR waveguide — wherever a periodic pattern and a coating work together.
The efficiency of one order over wavelength × angle of incidence, or × azimuth at a fixed angle: how far off the design direction the device still works, and where Rayleigh anomalies cross the band.
The metasurface without the films and the films without the metasurface, drawn next to the device — see what each part does.
Open the problem files of the desktop MetaLayer and its samples — or describe the device in words to the OptiLayer AI agent: it sets up the grating and its targets, and one click opens them here.
An absorbing substrate of a given thickness: its absorption along every order's path, its back face, and the light it traps.
Measured n and k of thin-film materials, glasses and crystals with their primary sources — or a table of your own.
An Excel workbook with the spectra of every order, the group delay, the robustness and the FDTD check; projects saved and opened as files.
Volume licenses, on-premise deployment, and academic pricing available. Contact us for a custom quote.
Contact SalesDiffraction orders, group delay and robustness of the whole device — the pattern and the coating together. Start your free trial now.